Title :
1/f Noise Measurement in Semicontinuous Metal Films
Author :
Takagi, Keiji ; Mizunami, Toru ; Masuda, Satoshi
Author_Institution :
Kyushu Institute of Technology, Sensuicho, Japan
fDate :
12/1/1987 12:00:00 AM
Abstract :
The noise of gold and aluminum films was measured. All noise spectra are the 1/f type. The noise of the gold films increases in proportion to the fifth power of the resistance in the high resistance range and to the cube of the resistance in the low resistance range. The noise of thin films is qualitatively characterized. The resistance dependences were explained by a static-contact model and granular-resistor model, respec- tively.
Keywords :
Aluminum materials/devices; Gold materials/devices; Thin-film circuit noise; Aluminum; Current measurement; Electrical resistance measurement; Gold; Noise generators; Noise level; Noise measurement; Noise shaping; Temperature dependence; Transistors;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1987.1134775
