DocumentCode :
951774
Title :
The Electrical Effect of Single-Chip CMOS Packages
Author :
Foster, Eric M.
Author_Institution :
IBM Corp.,NY
Volume :
10
Issue :
4
fYear :
1987
fDate :
12/1/1987 12:00:00 AM
Firstpage :
593
Lastpage :
603
Abstract :
It is becoming increasingly important to understand the electrical effects of packaging before being committed to expensive hardware. Unfortunately, complex and time-consuming computer simulation is necessary to predict accurately the electrical performance of a package system. While this type of analysis must be done during the final stage of the development cycle to ensure an adequate design, a simpler technique is needed in the conceptualization stage. Several generic package designs have been characterized and inserted into two comprehensive simulation models that were operated at various CMOS switching speeds. The results of this detailed study are summarized in a series of charts that correlate relative packaging system noise to both module design and to device speed. In referring to these graphs, the electrical performance of one packaging approach with respect to another can be approximated. This information can be used during the trade-off studies associated with the early phase of development to determine the effect of various design alternatives.
Keywords :
CMOS integrated circuits; CMOS technology; Crosstalk; Fluctuations; Guidelines; Hardware; Packaging; Power supplies; Power transmission lines; Semiconductor device modeling; Switches;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1987.1134782
Filename :
1134782
Link To Document :
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