Analysis of lossy mode cut-off conditions in planar waveguides with semiconductor guiding layer

Author

Marciniak, M. ; Grzegorzewski, J. ; Szustakowski, M.

Author_Institution

Acad. of Telecommun., Zegrze, Poland

Volume

140

Issue

4

fYear

1993

fDate

8/1/1993 12:00:00 AM

Firstpage

247

Lastpage

252

Abstract

It is known that a dielectric waveguide with semiconductor cladding exhibits a maximum attenuation of a given polarisation of light when the cladding thickness corresponds to the cut-off of any guided mode of the same polarisation that the semiconductor layer supports itself. In this paper mode cut-off conditions in the semiconductor layer are analysed and analytic expressions for the layer cut-off thicknesses are developed. The results show good accuracy when compared with more sophisticated numerical analysis techniques consuming a large amount of computer time. Design curves for silicon-clad polarisers on Ti: LiNbO ₃ and glass waveguides are developed from the presented theory

Keywords

claddings; integrated optics; light polarisation; lithium compounds; optical design techniques; optical losses; optical polarisers; optical waveguide theory; titanium; LiNbO₃:Ti; Si-clad polariser design curves; cladding thickness; computer time; dielectric waveguide; glass waveguides; guided mode; layer cut-off thicknesses; light polarisation; lossy mode cut-off conditions; maximum attenuation; mode cut-off; mode cut-off conditions; planar waveguides; semiconductor cladding; semiconductor guiding layer; semiconductor layer;

fLanguage

English

Journal_Title

Optoelectronics, IEE Proceedings J

Publisher

iet

ISSN

0267-3932

Type

jour

Filename

236304