Title :
The Bonding Characteristics of Gold in Ultrahigh Vacuum
Author :
Cuthrell, Robert E. ; Tipping, Donald W.
Author_Institution :
Sandia Lab.,Albuquerque,N. Mex
fDate :
3/1/1974 12:00:00 AM
Abstract :
The results are reported of a study of the factors which affect the solid-phase bonding of gold wire electrical leads. Gold surfaces were cleaned by sputtering and joined with precise control of mechanical and environmental variables. Contact resistance measurements as a function of load, coefficients of adhesion, and laser interference fringe photo-microtopographs were used as diagnostics to show the effects of cleaning, annealing, loading, and creep. Ultrahigh vacuum techniques and vibration isolation were essential to reproducibly forming and measuring the strengths of solid-phase bonds between gold samples and between gold and tungsten.
Keywords :
Contact materials; Metal-insulator-semiconductor structures; Thermocompression bonding; Ultrasonic bonding; Vacuum effects; Bonding; Contact resistance; Electric variables control; Electrical resistance measurement; Gold; Mechanical variables control; Sputtering; Surface resistance; Vibration measurement; Wire;
Journal_Title :
Parts, Hybrids, and Packaging, IEEE Transactions on
DOI :
10.1109/TPHP.1974.1134828