• DocumentCode
    952232
  • Title

    Adaptive cancellation of fixed-pattern noise in c.c.d. serial-parallel-serial memory

  • Author

    Geddes, R.C. ; Cowan, C.F.N. ; Mavor, J. ; Dickson, J.F.

  • Author_Institution
    University of Edinburgh, School of Engineering Science, Edinburgh, UK
  • Volume
    15
  • Issue
    16
  • fYear
    1979
  • Firstpage
    505
  • Lastpage
    507
  • Abstract
    The letter addresses the problem of the effective implementation of long analogue delay lines. Charge-coupled devices (c.c.d.) appear attractive for this application but suffer from the problem of signal smearing due to imperfect charge transfer. Although s.p.s. delay-line configurations minimise charge-transfer inefficiency, they emphasise the significance of dark current which can cause severe fixed-pattern noise problems in this architecture. A scheme is proposed here for the cancellation of fixed-pattern noise in s.p.s. delay lines and results are presented to demonstrate the effectiveness of the system.
  • Keywords
    charge-coupled device circuits; delay lines; CCD; adaptive cancellation of fixed pattern noise; charge transfer inefficiency; dark current; imperfect charge transfer; long analogue delay lines; serial parallel serial memory; signal smearing;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19790365
  • Filename
    4243481