Title :
Instrumentation for electron beam lithography
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA
fDate :
9/1/1974 12:00:00 AM
Keywords :
Electron-beam fabrication; Magnetic bubble devices; Brightness; Electron beams; Electron optics; Guns; Instruments; Lanthanum; Lenses; Lithography; Optical sensors; Resists;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1974.1058450