Title : 
Field-effect transistor based on /spl beta/-SiC nanowire
         
        
            Author : 
Zhou, W.M. ; Fang, F. ; Hou, Z.Y. ; Yan, L.J. ; Zhang, Y.F.
         
        
            Author_Institution : 
Inst. of Micro & Nano Sci. & Technol., Shanghai Jiao Tong Univ., China
         
        
        
        
        
            fDate : 
6/1/2006 12:00:00 AM
         
        
        
        
            Abstract : 
/spl beta/-SiC nanowires were synthesized by the way of high-frequency induction with diameter range between 10 to 25 nm and the length was up to 10 μm. Field-effect transistor was fabricated with those synthesized /spl beta/-SiC nanowires. The carrier mobilities of the n-type SiCFETs were 6.4 and 15.9 cm2/V/spl middot/s when V/sub ds/ is 0.01 and 0.05 V at room temperature, respectively. At high temperature, the drain current increased by one order of magnitude than it did at room temperature. The carrier mobility versus 1000/T agreed well with the Arrhenius function. The SiCFETs Would be used as electrical devices operated in high temperatures because of their superior properties.
         
        
            Keywords : 
carrier mobility; field effect transistors; high-temperature electronics; nanowires; silicon compounds; 0.01 to 0.05 V; 10 micron; 10 to 25 nm; Arrhenius function; SiC; carrier mobilities; drain current; field effect transistors; nanowires; Argon; Educational technology; Electrodes; FETs; Gold; Optical films; Scanning electron microscopy; Silicon carbide; Temperature; Voltage; Field-effect transistor (FET); high temperature;
         
        
        
            Journal_Title : 
Electron Device Letters, IEEE
         
        
        
        
        
            DOI : 
10.1109/LED.2006.874219