• DocumentCode
    952724
  • Title

    Current-Voltage Relations for Thin-Film Tunneling Structures

  • Author

    Scales, John L., III

  • Author_Institution
    Harry Diamond Lab., Washington D.C.
  • Volume
    11
  • Issue
    1
  • fYear
    1964
  • fDate
    3/1/1964 12:00:00 AM
  • Firstpage
    9
  • Lastpage
    15
  • Abstract
    Current-voltage characteristics have been calculated for a structure consisting of two metal surfaces separated by a thin film of "insulating" material. The analysis includes both tunneling and thermionic emission, and takes account of dielectric constant and image force. Curves of current density vs field strength are presented for various values of barrier height and dielectric constant. Several comparisons of theory with experiment are given, and it is concluded that the theory overemphasizes the thermionic contribution.
  • Keywords
    Current-voltage characteristics; Dielectric constant; Dielectric materials; Dielectric thin films; Dielectrics and electrical insulation; Image analysis; Inorganic materials; Thermionic emission; Transistors; Tunneling;
  • fLanguage
    English
  • Journal_Title
    Component Parts, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0097-6601
  • Type

    jour

  • DOI
    10.1109/TCP.1964.1134968
  • Filename
    1134968
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=952724