DocumentCode :
952795
Title :
Alignment of Overlapping Locally Scaled Patches for Multidimensional Scaling and Dimensionality Reduction
Author :
Yang, Li
Author_Institution :
Western Michigan Univ., Kalamazoo
Volume :
30
Issue :
3
fYear :
2008
fDate :
3/1/2008 12:00:00 AM
Firstpage :
438
Lastpage :
450
Abstract :
Data observations that lie on a manifold can be approximated by a collection of overlapping local patches, the alignment of which in a low-dimensional euclidean space provides an embedding of the data. This paper describes an embedding method using classical multidimensional scaling as a local model based on the fact that a manifold locally resembles a euclidean space. A set of overlapping neighborhoods are chosen by a greedy approximation algorithm of minimum set cover. Local patches derived from the set of overlapping neighborhoods by classical multidimensional scaling are aligned in order to minimize a residual measure, which has a quadratic form of the resulting global coordinates and can be minimized analytically by solving an eigenvalue problem. This method requires only distances within each neighborhood and provides locally isometric embedding results. The size of the eigenvalue problem scales with the number of overlapping neighborhoods rather than the number of data points. Experiments on both synthetic and real-world data sets demonstrate the effectiveness of this method. Extensions and variations of the method are discussed.
Keywords :
data analysis; data reduction; eigenvalues and eigenfunctions; greedy algorithms; least squares approximations; set theory; Euclidean space; data observations; dimensionality reduction; eigenvalue problem; embedding method; greedy approximation algorithm; minimum set cover; multidimensional scaling; overlapping locally scaled patches; overlapping neighborhoods; Algorithms; Artificial Intelligence; Biometry; Face; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2007.70706
Filename :
4359957
Link To Document :
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