Title :
Specific Techniques to Be Used in Developing Hi-Reliability Connector Specifications
Author_Institution :
Burndy Cor.
fDate :
6/1/1964 12:00:00 AM
Keywords :
Circuits; Connectors; Defense industry; Electronics industry; Materials testing; Production; Qualifications; Resistors; Stress; Voltage;
Journal_Title :
Component Parts, IEEE Transactions on
DOI :
10.1109/TCP.1964.1135002
