Title :
A New Precision Film Resistor Exhibiting Bulk Properties
Author :
Zandman, Felix ; Stein, Sidney J.
Author_Institution :
Vishay Instruments, Inc.
fDate :
6/1/1964 12:00:00 AM
Keywords :
Capacitive sensors; Dielectric substrates; Frequency; Instruments; Resistors; Semiconductor films; Stability; Strain control; Temperature; Wire;
Journal_Title :
Component Parts, IEEE Transactions on
DOI :
10.1109/TCP.1964.1135008
