• DocumentCode
    953251
  • Title

    An adaptive checker for the fully differential analog code

  • Author

    Stratigopoulos, Haralampos-G D. ; Makris, Yiorgos

  • Author_Institution
    Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
  • Volume
    41
  • Issue
    6
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    1421
  • Lastpage
    1429
  • Abstract
    This paper discusses the design of an adaptive checker for concurrent error detection in fully differential analog circuits. The checker monitors the fully differential analog code, which states that, in nominal operation, the common mode signal of any symmetric node pair remains within a narrow band around the quiescent DC bias. The checker measures the common mode voltage and reports an error whenever the measured value exceeds a threshold. Its key feature is that this comparison threshold is dynamically adjusted in order to lower the probability of false alarms. The design was fabricated in a 0.5-μm CMOS technology. The chip test results prove the feasibility of the adaptive thresholding concept.
  • Keywords
    analogue circuits; error detection; 0.5 micron; CMOS technology; adaptive checker; adaptive thresholding concept; analog circuit testing; common mode voltage; concurrent error detection; fully differential analog code; Analog circuits; CMOS technology; Circuit noise; Circuit testing; Clocks; Narrowband; Noise cancellation; Nonlinear filters; Semiconductor device measurement; Threshold voltage; Analog circuit testing; checkers; concurrent error detection; fully differential circuits;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2006.874272
  • Filename
    1637606