DocumentCode
953251
Title
An adaptive checker for the fully differential analog code
Author
Stratigopoulos, Haralampos-G D. ; Makris, Yiorgos
Author_Institution
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
Volume
41
Issue
6
fYear
2006
fDate
6/1/2006 12:00:00 AM
Firstpage
1421
Lastpage
1429
Abstract
This paper discusses the design of an adaptive checker for concurrent error detection in fully differential analog circuits. The checker monitors the fully differential analog code, which states that, in nominal operation, the common mode signal of any symmetric node pair remains within a narrow band around the quiescent DC bias. The checker measures the common mode voltage and reports an error whenever the measured value exceeds a threshold. Its key feature is that this comparison threshold is dynamically adjusted in order to lower the probability of false alarms. The design was fabricated in a 0.5-μm CMOS technology. The chip test results prove the feasibility of the adaptive thresholding concept.
Keywords
analogue circuits; error detection; 0.5 micron; CMOS technology; adaptive checker; adaptive thresholding concept; analog circuit testing; common mode voltage; concurrent error detection; fully differential analog code; Analog circuits; CMOS technology; Circuit noise; Circuit testing; Clocks; Narrowband; Noise cancellation; Nonlinear filters; Semiconductor device measurement; Threshold voltage; Analog circuit testing; checkers; concurrent error detection; fully differential circuits;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2006.874272
Filename
1637606
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