DocumentCode :
953613
Title :
Design Implications of Prow Formation During Electrical Contact Closure
Author :
Cuthrell, Robert E.
Author_Institution :
Sandia Laboratories
Volume :
11
Issue :
2
fYear :
1975
fDate :
6/1/1975 12:00:00 AM
Firstpage :
110
Lastpage :
114
Abstract :
The contact resistance behavior of electrical contacts which were closed on oxide and sulfide contaminants is reported. The minimum wipe which is required to break through contaminants and to produce ´a minimum contact resistance is approximately equivalent to the diameter of the load-bearing area. The tendency of contaminant accumulations, which are formed at the front surface of the moving contact, to break away and pass between the contacts is correlated with the extent of wipe. Some implications of these results in the design of electrical contacts to function in contaminating environments are discussed.
Keywords :
Contacts; Contamination; Environmental pollution; Resistance; Bonding; Circuits; Cleaning; Contact resistance; Dielectrics and electrical insulation; Friction; Pollution measurement; Polymer films; Surface contamination; Surface resistance;
fLanguage :
English
Journal_Title :
Parts, Hybrids, and Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
0361-1000
Type :
jour
DOI :
10.1109/TPHP.1975.1135053
Filename :
1135053
Link To Document :
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