Title :
Dephasing measure in the diffraction by a hologram grating
Author_Institution :
University of Wisconsin, Madison, WI
Abstract :
For the plane wave diffraction by a dielectric hologram grating, the angular and the wavelength sensitivity measures are systematically deduced and compared with the previous results.
Keywords :
Amplitude modulation; Dielectric measurements; Diffraction gratings; Electromagnetic scattering; Frequency; Partial differential equations; Permittivity; Slabs; Tellurium; Wavelength measurement;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1978.11082
