• DocumentCode
    953758
  • Title

    High-level synthesis of data paths for easy testability

  • Author

    Dhodhi, M.K. ; Ahmad, I. ; Ismaeel, A.A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Kuwait Univ., Safat, Kuwait
  • Volume
    142
  • Issue
    4
  • fYear
    1995
  • fDate
    8/1/1995 12:00:00 AM
  • Firstpage
    209
  • Lastpage
    216
  • Abstract
    The paper presents a method for high-level synthesis of easy testable data paths from a given behavioural description of a design. The synthesis process uses an approach based on a problem-space genetic algorithm (PSGA) to perform integrated scheduling, allocation of testable functional units and registers under area, delay and testability constraints. Testability at behavioural level can be enhanced by minimising the number of self-adjacent registers (self-loops). The main objective is to minimise the testability overhead (area and delay) while searching the design-space to provide a self-loop free architecture. Experiments on benchmarks show that self-loops can be eliminated with minimum additional hardware resources
  • Keywords
    ULSI; VLSI; built-in self test; data flow graphs; design for testability; genetic algorithms; high level synthesis; logic testing; ULSI; VLSI; behavioural description; behavioural level testability; benchmarks; data paths; delay constraints; easy testability; high-level synthesis; integrated scheduling; intelligent design space exploration; problem-space genetic algorithm; registers under area; self-adjacent registers; self-loops; testability constraints; testability overhead minimisation; testable functional units;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2409
  • Type

    jour

  • DOI
    10.1049/ip-cds:19952011
  • Filename
    465179