DocumentCode
953758
Title
High-level synthesis of data paths for easy testability
Author
Dhodhi, M.K. ; Ahmad, I. ; Ismaeel, A.A.
Author_Institution
Dept. of Electr. & Comput. Eng., Kuwait Univ., Safat, Kuwait
Volume
142
Issue
4
fYear
1995
fDate
8/1/1995 12:00:00 AM
Firstpage
209
Lastpage
216
Abstract
The paper presents a method for high-level synthesis of easy testable data paths from a given behavioural description of a design. The synthesis process uses an approach based on a problem-space genetic algorithm (PSGA) to perform integrated scheduling, allocation of testable functional units and registers under area, delay and testability constraints. Testability at behavioural level can be enhanced by minimising the number of self-adjacent registers (self-loops). The main objective is to minimise the testability overhead (area and delay) while searching the design-space to provide a self-loop free architecture. Experiments on benchmarks show that self-loops can be eliminated with minimum additional hardware resources
Keywords
ULSI; VLSI; built-in self test; data flow graphs; design for testability; genetic algorithms; high level synthesis; logic testing; ULSI; VLSI; behavioural description; behavioural level testability; benchmarks; data paths; delay constraints; easy testability; high-level synthesis; integrated scheduling; intelligent design space exploration; problem-space genetic algorithm; registers under area; self-adjacent registers; self-loops; testability constraints; testability overhead minimisation; testable functional units;
fLanguage
English
Journal_Title
Circuits, Devices and Systems, IEE Proceedings -
Publisher
iet
ISSN
1350-2409
Type
jour
DOI
10.1049/ip-cds:19952011
Filename
465179
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