High Pulse Power Failure of Discrete Resistors

Theoretical and experimental studies have been conducted on discrete resistors to determine the; power required to cause failure as a function of pulse width over the range 1µs to 10 ms. Single pulses of increasing amplitude were applied until voltage breakdown occurred, the resistor shattered, or until a resistance change of 5% or more took place. Carbon composition (both slug and film type), wire-wound (both precision and power type) and film resistors were tested. Computer calculations, temperature cycling test,% and field plots were utilized to interpret the results.