• DocumentCode
    953777
  • Title

    Subspace-based signal analysis using singular value decomposition

  • Author

    Van der Veen, Alle-Jan ; Deprettere, Ed F. ; Swindlehurst, A. Lee

  • Author_Institution
    Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
  • Volume
    81
  • Issue
    9
  • fYear
    1993
  • fDate
    9/1/1993 12:00:00 AM
  • Firstpage
    1277
  • Lastpage
    1308
  • Abstract
    A unified approach is presented to the related problems of recovering signal parameters from noisy observations and identifying linear system model parameters from observed input/output signals, both using singular value decomposition (SVD) techniques. Both known and new SVD-based identification methods are classified in a subspace-oriented scheme. The SVD of a matrix constructed from the observed signal data provides the key step in a robust discrimination between desired signals and disturbing signals in terms of signal and noise subspaces. The methods that are presented are distinguished by the way in which the subspaces are determined and how the signal or system model parameters are extracted from these subspaces. Typical examples, such as the direction-of-arrival problem and system identification from input/output measurements, are elaborated upon, and some extensions to time-varying systems are given
  • Keywords
    array signal processing; identification; parameter estimation; reviews; signal processing; spectral analysis; state-space methods; algorithms; direction-of-arrival problem; input/output signals; linear system model parameters; noisy observations; robust discrimination; singular value decomposition; subspace-based signal analysis; subspace-oriented scheme; system identification; time-varying systems; Chirp modulation; Data mining; Density estimation robust algorithm; Linear systems; Matrix decomposition; Noise robustness; Signal analysis; Signal processing; Singular value decomposition; Time series analysis;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.237536
  • Filename
    237536