Title :
Flash memory goes mainstream
Author :
Dipert, Brian ; Hebert, Lou
Author_Institution :
Intel Corp., Folsom, CA, USA
Abstract :
The operation of the flash memory, which has matured over the last five years from a novelty product, is described. Both dual and single supply voltage devices are considered. Flash memory cycling, data reliability, program/erase algorithms, and blocking are discussed. Three approaches to flash memories are examined. The uses of these devices and some new architectures are considered.<>
Keywords :
data integrity; digital storage; memory architecture; architectures; blocking; cycling; data integrity; data reliability; flash memory; program/erase algorithms; supply voltage; Costs; EPROM; Electrons; Flash memory; Flash memory cells; Grounding; Nonvolatile memory; Threshold voltage; Tunneling; Turning;
Journal_Title :
Spectrum, IEEE
