Title :
A case study of C.mmp, Cm*, and C.vmp: Part II—Predicting and calibrating reliability of multiprocessor systems
Author :
Siewiorek, Daniel P. ; Kini, Vittal ; Joobbani, Rostam ; Bellis, Harold
Author_Institution :
Carnegie-Mellon University, Pittsburgh, PA
Abstract :
This paper focuses on measurement and modeling of hard failures in multiprocessors. The failure rate predictions of the Military Standardization Handbook 217B (MIL 217B) are compared with semiconductor chip vendor data and data from Carnegie-Mellon University´s multiprocessor systems. Based on these comparisons a modified MIL 217B model is proposed. The modified model is employed to calculate module failure rates for the three multiprocessors designed, implemented, and currently operating at CMU. Hard failure reliability models for these three systems are presented. These models use the calculated module failure rates as a basis for a consistent comparison of the three systems.
Keywords :
Calibration; Condition monitoring; Conductors; Contracts; Engineering drawings; Military standards; Multiprocessing systems; Predictive models; Semiconductor device measurement; Standardization;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1978.11112
