• DocumentCode
    953990
  • Title

    The use of Huygens´ equivalence principle for solving the volume integral equation of scattering

  • Author

    Chew, W.C. ; Lu, Cai-Cheng

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    41
  • Issue
    7
  • fYear
    1993
  • fDate
    7/1/1993 12:00:00 AM
  • Firstpage
    897
  • Lastpage
    904
  • Abstract
    An algorithm is introduced to solve the volume integral equation of scattering. A volume scatterer is first divided into N subscatterers. Then the subscatterers are divided into four groups, and the groups are in turn divided into four subgroups and so on. By using the idea found in many fast algorithms, a smaller problem can hence be nested within a larger problem. Moreover, by way of Huygen´s equivalence principle, the scattering properties of a group of subscatterers in a volume can be replaced by a group of subscatterers distributed on a surface enclosing the volume. This idea is used as the basis of an algorithm which solves the scattering problem in several stages, where at each stage the interaction matrix algorithm is first used to find the scattering solution of each subgroup of subscatterers. Subscatterers are then replaced by equivalent surface subscatterers which are used in the next stage. This results in a reduction in the number of subscatterers at every stage. This algorithm can be shown to have a CPU time asymptotically proportional to N1.5 for N subscatterers
  • Keywords
    computational complexity; electromagnetic wave scattering; integral equations; Huygens´ equivalence principle; computational complexity; electromagnetic scattering; interaction matrix algorithm; subscatterers; volume integral equation; Aggregates; Computational complexity; Differential equations; Integral equations; Military computing; Moment methods; Scattering; Sparse matrices; Strips; Transforms;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.237620
  • Filename
    237620