Title :
Three-dimensional Gaussian beam reflection from short-circuited isotropic ferrite slab
Author :
Luk, K.M. ; Cullen, A.L.
Author_Institution :
Dept of Electron. Eng., City Polytech. of Hong Kong, Kowloon, Hong Kong
fDate :
7/1/1993 12:00:00 AM
Abstract :
The plane wave spectrum analysis is extended to the study of three-dimensional Gaussian beam propagation and scattering. The reflection of a three-dimensional circular Gaussian beam from a parallel-sided ferrite slab, backed by a ground plane, is then investigated. The beam field is represented by an angular continuous spectrum of plane waves. Using the Fresnel reflection coefficients of the short-circuited slab for both perpendicular and parallel polarizations, a paraxial approximation for the reflected beam field is derived. It is found that after reflection from the short-circuited slab, the circular Gaussian beam becomes, in general, an elliptical Gaussian beam, and the beam axis is displaced from the position predicted by ray optics. For the thin slab case, approximate formulas for the phase center difference and the lateral shift are determined. The relevance of these results to a new method of ferrite measurement is explained
Keywords :
electromagnetic wave propagation; electromagnetic wave reflection; electromagnetic wave scattering; ferrites; microwave measurement; spectral analysis; 3D Gaussian beam; Fresnel reflection coefficients; Gaussian beam propagation; Gaussian beam reflection; Gaussian beam scattering; MM wave; circular Gaussian beam; elliptical Gaussian beam; ferrite measurement; lateral shift; parallel polarizations; parallel-sided ferrite slab; paraxial approximation; perpendicular polarisation; phase center difference; plane wave spectrum analysis; reflected beam field; short-circuited isotropic ferrite slab; Dielectrics; Electromagnetic scattering; Ferrites; Fresnel reflection; Magnetic materials; Millimeter wave measurements; Optical reflection; Optical scattering; Slabs; Wavelength measurement;
Journal_Title :
Antennas and Propagation, IEEE Transactions on