DocumentCode :
954184
Title :
Perturbation treatment of mixing in Josephson junctions
Author :
Levinsen, M.T. ; Ulrich, B.T.
Author_Institution :
IEEE TMAG
Volume :
11
Issue :
2
fYear :
1975
fDate :
3/1/1975 12:00:00 AM
Firstpage :
807
Lastpage :
810
Abstract :
We consider a current biased, resistively shunted josephson junction irradiated at two frequencies. The perturbation technique introduced by Aslamasov and Larkin is used in the calculations. Both signals are treated as perturbations. The second order calculation yields the size of the mixing steps at V_{\\pm}=h(\\omega _{1}\\pm\\omega _{2})/2e . As in the case of a single frequency we show that subharmonic mixing steps are absent. The amplitude of the voltage oscillation at the difference and sum frequencies is shown to be non-zero at all voltages. We calculate the microwave resistance for one frequency ω2to third order in the perturbation. There are negative resistance regions near V\\pm (as well as near V_{2}= \\hom ega_{2}/2e ). Near V, the negative resistance region appears for bias voltage V just above V_{-} , while near V the region appears for V just below V_{+} . This means that when an incident frequency mixes with a cavity mode the mixing step at V_{-} will be inverted compared to the cavity step itself.
Keywords :
Heterodyning; Josephson device mixers/frequency converters; Microwave mixers; Frequency; Intersymbol interference; Josephson effect; Josephson junctions; Laboratories; Local oscillators; NASA; Perturbation methods; Signal analysis; Voltage;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1975.1058612
Filename :
1058612
Link To Document :
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