Perturbation treatment of mixing in Josephson junctions

Author

Levinsen, M.T. ; Ulrich, B.T.

Author_Institution

IEEE TMAG

Volume

11

Issue

2

fYear

1975

fDate

3/1/1975 12:00:00 AM

Firstpage

807

Lastpage

810

Abstract

We consider a current biased, resistively shunted josephson junction irradiated at two frequencies. The perturbation technique introduced by Aslamasov and Larkin is used in the calculations. Both signals are treated as perturbations. The second order calculation yields the size of the mixing steps at $V_{\\pm}=h(\\omega _{1}\\pm\\omega _{2})/2e$ . As in the case of a single frequency we show that subharmonic mixing steps are absent. The amplitude of the voltage oscillation at the difference and sum frequencies is shown to be non-zero at all voltages. We calculate the microwave resistance for one frequency ω2to third order in the perturbation. There are negative resistance regions near $V\\pm$ (as well as near $V_{2}= \\hom ega_{2}/2e$ ). Near V, the negative resistance region appears for bias voltage V just above $V_{-}$ , while near V the region appears for V just below $V_{+}$ . This means that when an incident frequency mixes with a cavity mode the mixing step at $V_{-}$ will be inverted compared to the cavity step itself.

Keywords

Heterodyning; Josephson device mixers/frequency converters; Microwave mixers; Frequency; Intersymbol interference; Josephson effect; Josephson junctions; Laboratories; Local oscillators; NASA; Perturbation methods; Signal analysis; Voltage;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.1975.1058612

Filename

1058612