DocumentCode :
954553
Title :
Moisture, Myths, and Microcircuits
Author :
Thomas, Robert W.
Author_Institution :
Griffiss Air Force Base,NY
Volume :
12
Issue :
3
fYear :
1976
fDate :
9/1/1976 12:00:00 AM
Firstpage :
167
Lastpage :
171
Abstract :
The development and use of an accurate method for the measurement of moisture in microelectronic packages has uncovered many myths related to the assembly and processing of microcircuit packages. The myths indicated a general lack of awareness on the part of the manufacturer and user of the basic physics and chemistry of moisture adsorption, desorption, and leak mechanisms. This paper describes the mass spectrometer method developed to measure moisture in electronic packages, and experiments conducted to disprove myths associated with moisture trapped within the hermetically sealed cavity.
Keywords :
Integrated circuit packaging; Mass spectroscopy; Moisture; Moisture measurement; Semiconductor device measurements; Assembly; Chemistry; Electron traps; Electronics packaging; Hermetic seals; Manufacturing; Mass spectroscopy; Microelectronics; Moisture measurement; Physics;
fLanguage :
English
Journal_Title :
Parts, Hybrids, and Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
0361-1000
Type :
jour
DOI :
10.1109/TPHP.1976.1135142
Filename :
1135142
Link To Document :
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