DocumentCode
954557
Title
InGaAs avalanche photodiode with InP p-n junction
Author
Kanbe, Hiroshi ; Susa, Nobuhiko ; Nakagome, Hiroshi ; Hiroaki, Ando
Author_Institution
NTT, Musashino Electrical Communication Laboratory, Musashino, Japan
Volume
16
Issue
5
fYear
1980
Firstpage
163
Lastpage
165
Abstract
A new InGaAs avalanche photodiode structure that has an InGaAs light absorption region and InP avalanche multiplying region is proposed. A dark-current density of 2.2 à 10¿3 A/cm2 at 90% of breakdown voltage and a multiplication factor of 45 were obtained for the new structure diode fabricated from a liquid-phase epitaxially grown wafer.
Keywords
III-V semiconductors; avalanche photodiodes; InGaAs avalanche photodiode; InP p-n junction; LPE; avalanche multiplying region; breakdown voltage; dark current density; light absorption region; multiplication factor;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19800117
Filename
4243913
Link To Document