Title :
Optimal and efficient probabilistic distributed diagnosis schemes
Author :
Lee, Sunggu ; Shin, Kang G.
Author_Institution :
Dept. of Electron. & Electr. Eng., Pohang Inst. of Sci. & Technol., South Korea
fDate :
7/1/1993 12:00:00 AM
Abstract :
The distributed self-diagnosis of a multiprocessor/multicomputer system based on interprocessor tests with imperfect fault coverage that permits intermittently faulty processors is addressed. Focusing on probabilistic diagnosis methods, the authors define several different categories of probabilistic diagnosis based on the type of fault syndrome information used in the diagnosis. Rigorous probabilistic analysis is then used to derive diagnosis algorithms optimal in terms of diagnostic accuracy for the diagnosis categories introduced. Analysis and simulations are used to evaluate the performance of the diagnosis algorithms introduced
Keywords :
fault tolerant computing; multiprocessing systems; diagnosis algorithms; diagnosis categories; distributed self-diagnosis; fault syndrome information; imperfect fault coverage; intermittently faulty processors; interprocessor tests; multicomputer system; multiprocessor; performance evaluation; probabilistic diagnosis methods; probabilistic distributed diagnosis schemes; simulations; Algorithm design and analysis; Analytical models; Automatic testing; Computational modeling; Fault diagnosis; Fault tolerant systems; H infinity control; Performance analysis; Space technology; System testing;
Journal_Title :
Computers, IEEE Transactions on