• DocumentCode
    954790
  • Title

    Optimal and efficient probabilistic distributed diagnosis schemes

  • Author

    Lee, Sunggu ; Shin, Kang G.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Pohang Inst. of Sci. & Technol., South Korea
  • Volume
    42
  • Issue
    7
  • fYear
    1993
  • fDate
    7/1/1993 12:00:00 AM
  • Firstpage
    882
  • Lastpage
    886
  • Abstract
    The distributed self-diagnosis of a multiprocessor/multicomputer system based on interprocessor tests with imperfect fault coverage that permits intermittently faulty processors is addressed. Focusing on probabilistic diagnosis methods, the authors define several different categories of probabilistic diagnosis based on the type of fault syndrome information used in the diagnosis. Rigorous probabilistic analysis is then used to derive diagnosis algorithms optimal in terms of diagnostic accuracy for the diagnosis categories introduced. Analysis and simulations are used to evaluate the performance of the diagnosis algorithms introduced
  • Keywords
    fault tolerant computing; multiprocessing systems; diagnosis algorithms; diagnosis categories; distributed self-diagnosis; fault syndrome information; imperfect fault coverage; intermittently faulty processors; interprocessor tests; multicomputer system; multiprocessor; performance evaluation; probabilistic diagnosis methods; probabilistic distributed diagnosis schemes; simulations; Algorithm design and analysis; Analytical models; Automatic testing; Computational modeling; Fault diagnosis; Fault tolerant systems; H infinity control; Performance analysis; Space technology; System testing;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.237729
  • Filename
    237729