• DocumentCode
    954957
  • Title

    Oxygen Embrittlement of Copper Leads

  • Author

    Panousis, Nicholas T. ; Wonsiewicz, Bud C. ; Condra, Lloyd W.

  • Author_Institution
    Bell Labs., Inc.
  • Volume
    13
  • Issue
    2
  • fYear
    1977
  • fDate
    6/1/1977 12:00:00 AM
  • Firstpage
    127
  • Lastpage
    132
  • Abstract
    Electrolytic tough pitch copper (known as ETP, CDA110, or copper alloy no. 110) is a material used in the manufacture of external leads for hybrid integrated circuits. Cracking during the formation of 90° bends and the relatively poor cyclic fatigue behavior of this material are identified as due to embrittlement caused by second-phase oxide inclusions. Optical and SEM examinations of failures led to the following model for embrittlement. Under the applied loads, voids nucleate at the second-phase inclusions; continued loading causes the voids to grow and coalesce, resulting in a fracture. This model is consistent with the published literature. Cyclic fatigue behavior, i.e., the median number of cycles to failure (MCTF), was found to vary inversely with the oxygen concentration. Over the range 10-650 ppm oxygen (by weight), the fatigue results could be represented by [100/MCTF] = 0.0228 [ppm oxygen] + 8.32. For both CDA110 and oxygen-free copper (CDA102 or copper alloy no. 102) the MCTF was found to vary inversely with the percent of bond deformation over the 10-60-percent range. Therefore, all cyclic fatigue comparisons among the various CDA110 and CDA102 specimens were made at a common bond deformation, chosen to be 35 percent. Oxygen-free copper with ~10 ppm oxygen was found to have about twice the MCTF as CDA110 with ~400 ppm oxygen.
  • Keywords
    Hybrid integrated circuit reliability; Bonding; Copper alloys; Fatigue; Gold; Hybrid integrated circuits; Nickel; Optical materials; Oxygen; Packaging; Testing;
  • fLanguage
    English
  • Journal_Title
    Parts, Hybrids, and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0361-1000
  • Type

    jour

  • DOI
    10.1109/TPHP.1977.1135182
  • Filename
    1135182