• DocumentCode
    955051
  • Title

    Single-crystal silicon-barrier Josephson junctions

  • Author

    Huang, C.L. ; Duzer, T.

  • Author_Institution
    IEEE TMAG
  • Volume
    11
  • Issue
    2
  • fYear
    1975
  • fDate
    3/1/1975 12:00:00 AM
  • Firstpage
    766
  • Lastpage
    769
  • Abstract
    We have made and tested 1250Å-thick silicon-barrier Josephson junctions. The junctions tested show supercurrent and have junction characteristics which may be useful for high-frequency applications. A detailed junction fabrication process and the effects of surface oxides on the junction characteristics are described.
  • Keywords
    Josephson devices; Boron; Fabrication; Impurities; Josephson junctions; Semiconductor films; Silicon; Sputter etching; Superconducting films; Superconductivity; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1975.1058702
  • Filename
    1058702