DocumentCode :
955057
Title :
Investigation of the size and spatial distribution of fillers in mold compounds after device packaging
Author :
Huang, Yue ; Bigio, David ; Pecht, Michael G.
Author_Institution :
CALCE Electron. Products & Syst. Center, Univ. of Maryland, College Park, MD
Volume :
29
Issue :
2
fYear :
2006
fDate :
6/1/2006 12:00:00 AM
Firstpage :
364
Lastpage :
370
Abstract :
Fillers are used in the molding compounds used to package semiconductor devices, as a means to lower costs and minimize the stress caused by thermal expansion mismatch between the silicon die and the molding compound. With ever finer feature size and increasing die dimensions, control of highly filled molding compound´s properties and processing parameters becomes more important. In this study, quantitative measures of the particle distribution of fillers in packaged devices were experimentally determined, including area fraction, size, and interparticle distance. The size and interparticle distance were statistically significant with respect to the position in the package. The difference of filler volume fraction at different positions within a package can be as large as 10%, and can cause a local coefficient of thermal expansion difference of about 4ppm/degC. A 2times3times3 ANOVA test was conducted to assess the statistical significance of these variations
Keywords :
moulding; semiconductor device packaging; thermal expansion; coefficient of thermal expansion; fillers spatial distribution; molding compound; semiconductor device packaging; Area measurement; Costs; Particle measurements; Semiconductor device packaging; Semiconductor devices; Silicon; Size control; Size measurement; Thermal expansion; Thermal stresses; Coefficient of thermal expansion (CTE); fillers; molding compound;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2006.875874
Filename :
1637771
Link To Document :
بازگشت