Title :
Reconvergence phenomenon in synchronous sequential circuits
Author :
Nanda, N.K. ; Bennetts, R.G.
Author_Institution :
University of Roorkee, Department of Electronics & Communication Engineering, Roorkee, India
Abstract :
The letter essentially explains the concepts of the fan-out reconvergence phenomenon as applied to synchronous sequential circuits. The influence of memory logic values and time dependence of reconvergence phenomena has been considered and is explained by suitable illustrative examples.
Keywords :
digital circuits; logic design; sequential circuits; digital circuits; logic; memory logic values effect; reconvergence phenomenon; synchronous sequential circuits; time dependence;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19800220
