• DocumentCode
    955270
  • Title

    Tab Lead Capacitor

  • Author

    Love, Gordon R. ; Mclaurin, E.D. ; Hucks, William E.

  • Author_Institution
    Components Department,Greenville,SC
  • Volume
    13
  • Issue
    3
  • fYear
    1977
  • fDate
    9/1/1977 12:00:00 AM
  • Firstpage
    279
  • Lastpage
    282
  • Abstract
    Differential thermal expansion between a monolithic chip capacitor and the common hybrid substrate materials gives rise to significant stresses in the chip. For conventional attach techniques and conventional chips, these stresses may exceed the strength of one or more of the components, chip, termination, substrate metallization, or solder, in the assembly with disastrous effects. Further, common choices of materials aggravate the basic problem by "building-in" opportunities for delayed failure due to slow formation of brittle intermetallies in the assembly. We have examined this problem in detail, and we offer a solution that incorporates material, process, and design innovations which essentially eliminate these problems as sources of device failure.
  • Keywords
    Ceramic capacitors; Component reliability; Hybrid integrated circuit reliability; Hybrid integrated circuit thermal factors; Assembly; Capacitors; Ceramics; Circuits; Geometry; Intermetallic; Lead; Metallization; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Parts, Hybrids, and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0361-1000
  • Type

    jour

  • DOI
    10.1109/TPHP.1977.1135215
  • Filename
    1135215