DocumentCode
955270
Title
Tab Lead Capacitor
Author
Love, Gordon R. ; Mclaurin, E.D. ; Hucks, William E.
Author_Institution
Components Department,Greenville,SC
Volume
13
Issue
3
fYear
1977
fDate
9/1/1977 12:00:00 AM
Firstpage
279
Lastpage
282
Abstract
Differential thermal expansion between a monolithic chip capacitor and the common hybrid substrate materials gives rise to significant stresses in the chip. For conventional attach techniques and conventional chips, these stresses may exceed the strength of one or more of the components, chip, termination, substrate metallization, or solder, in the assembly with disastrous effects. Further, common choices of materials aggravate the basic problem by "building-in" opportunities for delayed failure due to slow formation of brittle intermetallies in the assembly. We have examined this problem in detail, and we offer a solution that incorporates material, process, and design innovations which essentially eliminate these problems as sources of device failure.
Keywords
Ceramic capacitors; Component reliability; Hybrid integrated circuit reliability; Hybrid integrated circuit thermal factors; Assembly; Capacitors; Ceramics; Circuits; Geometry; Intermetallic; Lead; Metallization; Thermal expansion; Thermal stresses;
fLanguage
English
Journal_Title
Parts, Hybrids, and Packaging, IEEE Transactions on
Publisher
ieee
ISSN
0361-1000
Type
jour
DOI
10.1109/TPHP.1977.1135215
Filename
1135215
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