Title :
Reliability Evaluation and Failure Analysis for Multilayer Ceramic Chip Capacitors
Author :
Kobayashi, Toshio ; Ariyoshi, Hisashi ; Masuda, Akihiko
Author_Institution :
NTT public Corp.,Tokyo, Japan
fDate :
9/1/1978 12:00:00 AM
Abstract :
Reliability evaluation tests for multilayer ceramic chip capacitors mounted on a hybrid IC were implemented. Failure modes, failure mechanisms, and drift of characteristics were analyzed. Humidity acceleration as well as voltage and temperature accelerations were investigated to estimate the chip capacitor reliability. The chip capacitor reliability proved to be high and adequate for the service period of the communication system.
Keywords :
Ceramic capacitors; Component reliability; Failure analysis; Reliability testing; Acceleration; Capacitors; Ceramics; Failure analysis; Humidity; Hybrid integrated circuits; Integrated circuit testing; Nonhomogeneous media; Temperature; Voltage;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1978.1135275
