• DocumentCode
    955864
  • Title

    Ultra-High Density VLSI Modules

  • Author

    Ciccio, Joseph A. ; Thun, Rudolf E.

  • Author_Institution
    Raytheon Company,Bedford, MA
  • Volume
    1
  • Issue
    3
  • fYear
    1978
  • fDate
    9/1/1978 12:00:00 AM
  • Firstpage
    242
  • Lastpage
    248
  • Abstract
    A novel packaging approach is described for low-power digital VLSI (very large-scale integration) technologies, which provides low-capacity interconnections throughout and eliminates higher packaging levels. The approach is based on the use of hybrid circuits utilizing high-density interconnections on sapphire substractes with a Fotoceram (trademark-Corning Glass Company) backing. These sapphire/Fotoceram wafers are assembled in a single stack, and wafer-to-wafer interconnections are provided by a ring of elastomeric contacts. This assembly is mounted in a sealed container utilizing ebullient cooling. This design provides very high packaging densities, minimizes circuit delays, and is easily maintainable.
  • Keywords
    Digital integrated circuits; Hybrid integrated circuit packaging; Hybrid integrated-circuit interconnections; Integrated digital circuits; Assembly; Delay; Impedance; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit technology; Large scale integration; Logic circuits; MOS devices; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1978.1135276
  • Filename
    1135276