Title : 
Ultra-High Density VLSI Modules
         
        
            Author : 
Ciccio, Joseph A. ; Thun, Rudolf E.
         
        
            Author_Institution : 
Raytheon Company,Bedford, MA
         
        
        
        
        
            fDate : 
9/1/1978 12:00:00 AM
         
        
        
        
            Abstract : 
A novel packaging approach is described for low-power digital VLSI (very large-scale integration) technologies, which provides low-capacity interconnections throughout and eliminates higher packaging levels. The approach is based on the use of hybrid circuits utilizing high-density interconnections on sapphire substractes with a Fotoceram (trademark-Corning Glass Company) backing. These sapphire/Fotoceram wafers are assembled in a single stack, and wafer-to-wafer interconnections are provided by a ring of elastomeric contacts. This assembly is mounted in a sealed container utilizing ebullient cooling. This design provides very high packaging densities, minimizes circuit delays, and is easily maintainable.
         
        
            Keywords : 
Digital integrated circuits; Hybrid integrated circuit packaging; Hybrid integrated-circuit interconnections; Integrated digital circuits; Assembly; Delay; Impedance; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit technology; Large scale integration; Logic circuits; MOS devices; Very large scale integration;
         
        
        
            Journal_Title : 
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TCHMT.1978.1135276