• DocumentCode
    955906
  • Title

    Effects of capacitance at crossover wirings in power GaAs m.e.s.f.e.t.s.

  • Author

    Aono, Y. ; Higashisaka, A. ; Hasegawa, F.

  • Author_Institution
    Nippon Electric Co. Ltd., Central Research Laboratories, Kawasaki, Japan
  • Volume
    16
  • Issue
    11
  • fYear
    1980
  • Firstpage
    417
  • Lastpage
    418
  • Abstract
    Power GaAs f.e.t.s. with an air-bridge crossover were compared with those of SiO2 crossover to find the effect of the capacitance at the crossover points. The capacitance of SiO2 crossover points is much smaller than that of the gate pad or the gate busbar in power GaAs f.e.t.s, and deterioration of the microwave performance due to that capacitance is negligible.
  • Keywords
    Schottky gate field effect transistors; capacitance; SiO2 crossover; airbridge crossover; power GaAs MESFET;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19800291
  • Filename
    4244059