DocumentCode
955906
Title
Effects of capacitance at crossover wirings in power GaAs m.e.s.f.e.t.s.
Author
Aono, Y. ; Higashisaka, A. ; Hasegawa, F.
Author_Institution
Nippon Electric Co. Ltd., Central Research Laboratories, Kawasaki, Japan
Volume
16
Issue
11
fYear
1980
Firstpage
417
Lastpage
418
Abstract
Power GaAs f.e.t.s. with an air-bridge crossover were compared with those of SiO2 crossover to find the effect of the capacitance at the crossover points. The capacitance of SiO2 crossover points is much smaller than that of the gate pad or the gate busbar in power GaAs f.e.t.s, and deterioration of the microwave performance due to that capacitance is negligible.
Keywords
Schottky gate field effect transistors; capacitance; SiO2 crossover; airbridge crossover; power GaAs MESFET;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19800291
Filename
4244059
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