Title :
Ion Microprobe Analysis of Cathode Nickel Alloys
Author :
Wachi, F.M. ; Marquez, N. ; Shepherd, J.R.
Author_Institution :
Aerospace Corp.
fDate :
12/1/1978 12:00:00 AM
Abstract :
An ion-microprobe technique of analysis for manganese and other potentially detrimental impurities in machined cathode nickel alloy buttons is described. This nondestructive method does not jeopardize the subsequent performance characteristics of the nickel ahoy button as a substrate for the barium-strontium oxide emitter material. This analytical technique is currently used as a standard quality assurance/quality control procedure in the fabrication of cathode assemblies of traveling-wave tubes for space applications.
Keywords :
Chemistry; Ion-beam applications; Nickel alloys/compounds; Traveling-wave; Aerospace materials; Assembly; Cathodes; Electron emission; Fabrication; Impurities; Manganese; Nickel alloys; Quality assurance; Space exploration;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1978.1135294
