DocumentCode :
956108
Title :
Theoretical and practical aspects of three-terminal silicon heterostructure switches
Author :
Chol, Ajuoi M. ; Green, Roger J.
Author_Institution :
Dept. of Electr. Eng., Bradford Univ., UK
Volume :
36
Issue :
11
fYear :
1989
fDate :
11/1/1989 12:00:00 AM
Firstpage :
2481
Lastpage :
2491
Abstract :
The electrical switching characteristics of three-terminal silicon heterostructure switches in the presence and absence of DC base excitation are reported. A comparison of base-current dependence characteristics for two switches with different epilayer doping concentrations and epilayer layer thickness is also presented. Device switching and holding voltages and currents are found to be dependent on epilayer thickness and doping concentration. A qualitative comparison of theoretically calculated and experimentally measured current-voltage characteristics is made. Good correlation between the calculated and measured switching and holding voltages and currents is obtained for grounded emitter and grounded collector carrier injection.
Keywords :
elemental semiconductors; semiconductor device testing; semiconductor switches; silicon; DC base excitation; MPSS switch; Si three terminal heterostructure switches; base-current dependence characteristics; current-voltage characteristics; electrical switching characteristics; epilayer doping concentrations; epilayer thickness; grounded collector carrier injection; grounded emitter carrier injection; holding voltages; switching voltage; Conductivity; Current measurement; Current-voltage characteristics; Doping; Electrons; Feedback loop; P-n junctions; Silicon; Spontaneous emission; Switches; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.43671
Filename :
43671
Link To Document :
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