• DocumentCode
    956136
  • Title

    The modulated-gate FET-a novel MOSFET structure exhibiting controlled negative resistance

  • Author

    Gill, B.S. ; Heasell, E.L.

  • Author_Institution
    Dept. of Electr. Eng., Waterloo Univ., Ont., Canada
  • Volume
    36
  • Issue
    11
  • fYear
    1989
  • fDate
    11/1/1989 12:00:00 AM
  • Firstpage
    2506
  • Lastpage
    2512
  • Abstract
    In a study of MOSFET structures that have a resistive gate, devices were fabricated using undoped polysilicon as the gate electrode. When the distribution of the channel charge was varied by changing the drain voltage, the induced gate charge varied. It was found that, in these structures the induced gate charge makes a major contribution to the local conductivity of the gate. The local value of gate resistance is modulated by changes of channel charge. if a current flows in the gate, then the gate potential distribution is changed when VDS is varied. Under suitable operating conditions an increase in drain voltage can lead to a decreasing or vanishing drain current.
  • Keywords
    insulated gate field effect transistors; negative resistance; MOSFET structures; channel charge distribution; controlled negative resistance; drain current; drain voltage; gate electrode; gate potential distribution; gate resistance; induced gate charge; local conductivity; modulated-gate FET; undoped polysilicon; Conductivity; Doping; Electrodes; Equations; FETs; Geometry; MOSFET circuits; Magnetic devices; Magnetic sensors; Sensor phenomena and characterization; Testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.43674
  • Filename
    43674