DocumentCode
956136
Title
The modulated-gate FET-a novel MOSFET structure exhibiting controlled negative resistance
Author
Gill, B.S. ; Heasell, E.L.
Author_Institution
Dept. of Electr. Eng., Waterloo Univ., Ont., Canada
Volume
36
Issue
11
fYear
1989
fDate
11/1/1989 12:00:00 AM
Firstpage
2506
Lastpage
2512
Abstract
In a study of MOSFET structures that have a resistive gate, devices were fabricated using undoped polysilicon as the gate electrode. When the distribution of the channel charge was varied by changing the drain voltage, the induced gate charge varied. It was found that, in these structures the induced gate charge makes a major contribution to the local conductivity of the gate. The local value of gate resistance is modulated by changes of channel charge. if a current flows in the gate, then the gate potential distribution is changed when VDS is varied. Under suitable operating conditions an increase in drain voltage can lead to a decreasing or vanishing drain current.
Keywords
insulated gate field effect transistors; negative resistance; MOSFET structures; channel charge distribution; controlled negative resistance; drain current; drain voltage; gate electrode; gate potential distribution; gate resistance; induced gate charge; local conductivity; modulated-gate FET; undoped polysilicon; Conductivity; Doping; Electrodes; Equations; FETs; Geometry; MOSFET circuits; Magnetic devices; Magnetic sensors; Sensor phenomena and characterization; Testing; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.43674
Filename
43674
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