DocumentCode :
956150
Title :
Reducing Post-Trim Drift of Thin-Film Resistors by Optimizing YAG Laser Output Characteristics
Author :
Dow, Robert ; Mauck, Michael ; Richardson, Thomas ; Swenson, Edward
Author_Institution :
Bell Labs.
Volume :
1
Issue :
4
fYear :
1978
fDate :
12/1/1978 12:00:00 AM
Firstpage :
392
Lastpage :
397
Abstract :
A study to determine the effects of laser parameters on tantalum nitride resistor stability is presented. A model Of the laser heat affected zone is proposed which relates laser pulse width, power, wavelength, repetition rate, and waist size parameters to energy delivered to remaining resistor material. Samples of qualified tantalum nitride resistors are trimmed with a range of laser parameters, and the results are compared with the model. The excellent agreement between the model and experiment allows these results to be used for process control and throughput versus tolerance calculations.
Keywords :
Laser applications, materials processing; Neodymium:YAG lasers; Thin-film resistors; Laser modes; Laser stability; Optical materials; Optical pulses; Power lasers; Process control; Resistors; Space vector pulse width modulation; Throughput; Transistors;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1978.1135306
Filename :
1135306
Link To Document :
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