Title :
A coherent hybrid fiber-optic probe for mapping induced birefringence in GaAs structures
Author :
Mazzoni, David L. ; Cho, Kyuman ; Davis, Christopher C.
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
fDate :
7/1/1993 12:00:00 AM
Abstract :
A very sensitive fiber interferometric sensor for remote mapping of electrooptically induced birefringence in GaAs and other materials is reported. This interferometer can be used to analyze and characterize GaAs structures without the need for elaborate testing equipment and procedures. The achieved spatial resolution is on the order of 0.5 μm
Keywords :
III-V semiconductors; birefringence; electro-optical effects; fibre optic sensors; gallium arsenide; light interferometers; GaAs structures; coherent hybrid fiber-optic probe; electrooptically induced birefringence; fiber interferometric sensor; remote mapping; spatial resolution; Birefringence; Circuit testing; Gallium arsenide; Optical fiber devices; Optical fiber polarization; Optical fiber testing; Optical fibers; Optical interferometry; Probes; Transmission line measurements;
Journal_Title :
Lightwave Technology, Journal of
