Title :
Measurement of Internal Stresses in Encapsulated Electronic Modules
Author :
Stucki, F.F. ; Fuller, W.D. ; Carpenter, R.D.
Author_Institution :
Lockheed Missiles & Space Co.
fDate :
6/1/1965 12:00:00 AM
Abstract :
The development of a hydrostatically-pressure sensitive transducer with dimensions much smaller than conventional pigtailed electronic components has made possible the measurement of environmentally-induced stresses in encapsulated electronic modules. Such measurements for a few encapsulants have shown large changes in internal stresses with small changes in ambient temperature, a shift in the stress transition range with formulation variations and changes in stress magnitude with component density in an electronic module.
Keywords :
Encapsulation-stresses; Microminiature; Pressure sensors; Encapsulation; Frequency; Human factors; Internal stresses; Plastics; Pressure measurement; Stress measurement; Temperature distribution; Transducers; Transformer cores;
Journal_Title :
Parts, Materials and Packaging, IEEE Transactions on
DOI :
10.1109/TPMP.1965.1135348