• DocumentCode
    956564
  • Title

    An FFT-based method to evaluate and compensate gain and offset errors of interleaved ADC systems

  • Author

    Pereira, J. M Dias ; Girao, P. M B Silva ; Serra, A. M Cruz

  • Author_Institution
    Centro de Electrotecnia Teorica e Medidas Electricas, Instituto Superior Tecnico, Lisbon, Portugal
  • Volume
    53
  • Issue
    2
  • fYear
    2004
  • fDate
    4/1/2004 12:00:00 AM
  • Firstpage
    423
  • Lastpage
    430
  • Abstract
    Interleaved analog-digital converter (ADC) systems can be used to increase the sampling rate for a given ADC implementation technique. In theory, the maximum sampling rate that can be achieved is limited only by the bandwidth and the practical limits related to the power and space of integrated circuits. In this paper, a solution to increase the sampling rate of a digitizing system based on interleaved ADCs is presented. An error analysis, which takes into consideration offset and gain errors of the different ADC channels, is performed in order to quantify the effect of such errors in the system´s performance. A software method based on the fast Fourier transform is presented for offset and gain error compensation of interleaved ADC associations. Numerical simulations and experimental results are used to validate the theory and the proposed compensation algorithm.
  • Keywords
    analogue-digital conversion; compensation; fast Fourier transforms; signal sampling; FFT-based method; Fourier transforms; analog-digital conversion; analog-digital converter; error analysis; error calibration; fast Fourier transform; gain error compensation; gain error evaluation; integrated circuits; interleaved ADC systems; maximum sampling rate; modeling; offset error compensation; offset error evaluation; parallel architectures; Analog-digital conversion; Bandwidth; Error analysis; Fast Fourier transforms; Instruments; Interleaved codes; Oscilloscopes; Parallel architectures; Performance gain; Sampling methods;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2004.823321
  • Filename
    1284874