DocumentCode
956589
Title
1.5¿1.7 ¿m v.p.e. InGaAsP/InP c.w. lasers
Author
Olsen, G.H. ; Zamerowski, T.J. ; Digiuseppe, N.J.
Author_Institution
RCA Laboratories, Princeton, USA
Volume
16
Issue
13
fYear
1980
Firstpage
516
Lastpage
518
Abstract
Room temperature c.w. lasing operation has been achieved at 1.55 ¿m with InGaAsP/InP devices and at 1.65 ¿m with InGaAs/InP devices prepared via vapour-phase epitaxy. Lasing threshold currents vary as exp (T ¿ 20)/T0 with 40<T0 <60°C.
Keywords
III-V semiconductors; gallium arsenide; indium compounds; semiconductor growth; semiconductor junction lasers; vapour phase epitaxial growth; CW lasing operation; InGaAsP-InP devices; vapour phase epitaxy;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19800361
Filename
4244131
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