Title :
ExPro-an expert system based process management system
Author :
Rastogi, Purag ; Kozicki, Michael N. ; Golshani, F.
Author_Institution :
Center for Solid State Electron. Res., Arizona State Univ., Tempe, AZ, USA
fDate :
8/1/1993 12:00:00 AM
Abstract :
The design, development and preliminary testing of ExPro, an expert-system-based process management system, is reported. This system is designed to provide process setup, monitoring, and supervisory control capabilities for applications in a real-time semiconductor manufacturing environment. ExPro is a rule-based system developed using the OPS-83 expert system language in a personal computer environment. It features a modular structure and includes an integrated analytical process simulator. The simulator is used to predict process parameters prior to processing and provide wafer state information from real-time (measured) process information when direct measurement of the state is impractical. The process selected for development and demonstration purposes was rapid thermal oxidation (RTO). Testing revealed that the accuracy of the system was within 1% of goal for the case of Si(100) wafers, but the less accurate Si(111) simulation led to much larger errors
Keywords :
computerised monitoring; expert systems; oxidation; process computer control; rapid thermal processing; semiconductor device manufacture; ExPro; OPS-83 expert system language; expert system; integrated analytical process simulator; modular structure; process management system; rapid thermal oxidation; real-time semiconductor manufacturing environment; rule-based system; supervisory control; wafer state information; Application software; Computational modeling; Computerized monitoring; Expert systems; Manufacturing processes; Process design; Real time systems; Semiconductor device manufacture; Supervisory control; System testing;
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on