DocumentCode
957248
Title
On the determination of device noise and gain parameters
Author
Sannino, Mario
Author_Institution
Università di Palermo, Palermo, Italy
Volume
67
Issue
9
fYear
1979
Firstpage
1364
Lastpage
1366
Abstract
The least-squares fitting of measured noise figures and gains versus input termination admittance is an established procedure to determine linear two-port noise and gain parameters. Unfortunately, the method is liable to the serious inconvenience of yielding often erroneous results or even results without physical meaning. Some criteria are suggested which allow the carrying out of measurements in such a manner as to safely avoid the above drawbacks.
Keywords
Admittance; Circuit noise; Electrons; Impedance; Network synthesis; Noise figure; Operational amplifiers; Signal synthesis; Transfer functions; Voltage;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1979.11458
Filename
1455727
Link To Document