• DocumentCode
    957248
  • Title

    On the determination of device noise and gain parameters

  • Author

    Sannino, Mario

  • Author_Institution
    Università di Palermo, Palermo, Italy
  • Volume
    67
  • Issue
    9
  • fYear
    1979
  • Firstpage
    1364
  • Lastpage
    1366
  • Abstract
    The least-squares fitting of measured noise figures and gains versus input termination admittance is an established procedure to determine linear two-port noise and gain parameters. Unfortunately, the method is liable to the serious inconvenience of yielding often erroneous results or even results without physical meaning. Some criteria are suggested which allow the carrying out of measurements in such a manner as to safely avoid the above drawbacks.
  • Keywords
    Admittance; Circuit noise; Electrons; Impedance; Network synthesis; Noise figure; Operational amplifiers; Signal synthesis; Transfer functions; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1979.11458
  • Filename
    1455727