Title :
Dark field acoustic microscopy
Author :
Sinclair, D.A. ; Smith, Ivor R.
Author_Institution :
University College London, Department of Electronic & Electrical Engineering, London, UK
Abstract :
Dark field microscopy has proved a useful tool in the examination of weakly diffracting quasitransparent objects. The letter demonstrates a novel implementation of this technique in acoustic microscopy.
Keywords :
acoustic microscopes; dark field acoustic microscopy;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19800435
