DocumentCode :
957583
Title :
The capacity of associative memories with malfunctioning neurons
Author :
Shirazi, M.N. ; Shirazi, M.N. ; Maekawa, Syota
Author_Institution :
Dept. of Inf. & Instrum., Kobe Univ., Japan
Volume :
4
Issue :
4
fYear :
1993
fDate :
7/1/1993 12:00:00 AM
Firstpage :
628
Lastpage :
635
Abstract :
Hopfield associative memories with αn malfunctioning neurons are considered. Using some facts from exchangeable events theory, the asymptotic storage capacity of such a network is derived as a function of the parameter α under stability and attractivity requirements. It is shown that the asymptotic storage capacity is (1-α)2n/(4 log n) under stability and (1-α)2(1-2ρ)2n/(4 log n) under attractivity requirements, respectively. Comparing these capacities with their maximum values corresponding to the case when there is no malfunctioning neurons, α=0, shows the robustness of the retrieval mechanism of Hopfield associative memories with respect to the existence of malfunctioning neurons. This result also supports the claim that neural networks are fault tolerant
Keywords :
Hopfield neural nets; content-addressable storage; fault tolerant computing; Hopfield associative memories; asymptotic storage capacity; attractivity; exchangeable events theory; fault tolerance; malfunctioning neurons; neural networks; stability; Associative memory; Asymptotic stability; Biological neural networks; Computer networks; Distributed computing; Fault tolerance; Humans; Neurons; Robustness; State-space methods;
fLanguage :
English
Journal_Title :
Neural Networks, IEEE Transactions on
Publisher :
ieee
ISSN :
1045-9227
Type :
jour
DOI :
10.1109/72.238317
Filename :
238317
Link To Document :
بازگشت