DocumentCode :
957684
Title :
Aging of Solder Connections to Ti-Pd-Au Films
Author :
Hall, Peter M. ; Condra, Lloyd W.
Author_Institution :
Bell Labs,PA
Volume :
2
Issue :
3
fYear :
1979
fDate :
9/1/1979 12:00:00 AM
Firstpage :
279
Lastpage :
283
Abstract :
Soldered connections to TiPdAu film composites show enhanced resistance changes (up to 0.02 ohms) during elevated temperature aging. This is attributed to solid-state dissolution by solder of Au from under the fillet edge, forming a AuSn intermetallic phase. The pull strength of soldered external leads decreases by as much as 40 percent during aging, probably by solid-state dissolution of Pd, forming PdSn4. Neither of these effects is expected to be troublesome at normal operating temperatures.
Keywords :
Soldering; Thin-film circuit reliability; Thin-film circuit thermal factors; Aging; Conductive films; Electrical resistance measurement; Gold; Lead; Soldering; Solid state circuits; Temperature; Testing; Thin film circuits;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1979.1135466
Filename :
1135466
Link To Document :
بازگشت