Title :
Reliable Electronics Through Protective Coating Techniques
Author :
Gamson, E.R. ; Henesian, A.
Author_Institution :
Stanford Research Institute
fDate :
9/1/1954 12:00:00 AM
Keywords :
Building materials; Coatings; Conducting materials; Dielectric materials; Electronic equipment testing; Humidity; Materials testing; Plastics; Printed circuits; Protection;
Journal_Title :
Component Parts, Transactions of the IRE Professional Group on
DOI :
10.1109/TPGCP.1954.1135512