Title :
Influence of multipath fading in 4 ¿-c.p.s.k. systems
Author :
Cung, T.T. ; Lecours, M. ; Huynh, H.T.
Author_Institution :
Université Laval, Electrical Engineering Department, Laval, Canada
Abstract :
The letter presents some analytical and numerical results relative to the performance of a 4¿-c.p.s.k. system in the presence of additive Gaussian noise and of multipath fading represented by a two-ray model with random phase difference.
Keywords :
fading; phase shift keying; random noise; CPSK system; Gaussian noise; analytical results; coherent phase shift keying; multipath fading; numerical results; two ray model;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19800521
