DocumentCode
958353
Title
Statistical approach to reduction of circuit performance variability
Author
Ilumoka, A. ; Spence, R.
Author_Institution
Imperial College of Science & Technology, Department of Electrical Engineering, London, UK
Volume
16
Issue
20
fYear
1980
Firstpage
761
Lastpage
762
Abstract
A statistical method is described for reducing the variance observed in the response of a circuit due to tolerances on circuit parameters.
Keywords
Monte Carlo methods; circuit reliability; network synthesis; reliability theory; statistical analysis; Monte Carlo method; circuit performance variability; circuit yield; reliability theory; statistical method;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19800540
Filename
4244317
Link To Document