DocumentCode :
958398
Title :
A new index-guided AlGaInP visible semiconductor laser with very small astigmatism
Author :
Takahashi, Y. ; Mannoh, M. ; Hoshina, J. ; Kamiyama, Sachiko ; Sasai, Y. ; Ohnaka, Kazuhiro ; Ogura, M.
Author_Institution :
Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
Volume :
36
Issue :
11
fYear :
1989
fDate :
11/1/1989 12:00:00 AM
Firstpage :
2607
Abstract :
Summary form only given. The authors demonstrate a novel index-guided AlGaInP visible semiconductor laser with very small astigmatism. This laser, composed of a twin-groove ridge stripe structure, is formed by a two-step MOVPE process (metal-organic vapor phase epitaxy). After the AlGaInP (0.8 mu m)/GaInP (0.8 mu m) double heterostructure is grown on an n-GaAs substrate, a 3.5- mu m-wide ridge stripe is formed by etching the p-AlGaInP cladding layer, leaving a 0.3- mu m-thick cladding layer on the GaInP active layer. Then, n-GaAs selective growth is carried out on the etched cladding layer, and a 4- mu m-wide twin groove just near the ridge stripe structure is fabricated by selectively etching the n-GaAs current blocking layer. Finally, a Si3N4 insulating block with low refractive index is formed only in the twin groove. As a result of the new structure, the visible laser is realized with not only the index-guide mode but also with low thermal resistivity ( approximately 50 K/W). Transverse-mode stabilized CW operation at room temperature was achieved at a lasing wavelength of 670 mu m, a threshold current of 70 mA, and an external differential quantum efficiency of 20%/facet.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; integrated optics; laser modes; optical waveguides; semiconductor growth; semiconductor junction lasers; vapour phase epitaxial growth; 20 percent; 670 micron; 70 mA; AlGaInP-GaInP-GaAs; GaAs; Si3N4 insulating block; astigmatism; cladding layer; current blocking layer; double heterostructure; etching; external differential quantum efficiency; index-guide mode; lasing wavelength; metal-organic vapor phase epitaxy; n-GaAs substrate; n-type substrate; p-type cladding; selective growth; threshold current; transverse-mode stabilised CW operation; twin-groove ridge stripe structure; two-step MOVPE process; visible semiconductor laser; Epitaxial growth; Epitaxial layers; Etching; Insulation; Laser modes; Laser stability; Refractive index; Semiconductor lasers; Substrates; Vision defects;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.43709
Filename :
43709
Link To Document :
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